The MD-F Series makes it possible to select the optimum laser scanning control to match the application. The optimum marking parameters can easily be selected for the material and content being marked. This makes it possible to improve marking time and quality in nearly every application.
Overlapping single lines
As the laser beam moves back and forth energy is lost.
If the conditions do not remain constant, irregular patterns form.
The lasers moves in a circular pattern to create a thick character to keep the energy concentrated.
It is possible to achieve uniform marking without irregularities.
[CONVENTIONAL] Moving back and forth across the cut width
It is difficult to keep the energy concentrated as the laser moves back and forth over the entire area.
[NEW FUNCTION] SCRATCH CONTROL
Processing is done by moving the laser beam back and forth across a shorter distance. This makes it possible to focus the energy, which leads to improvements in processing time.
[CONVENTIONAL] Fixed focal distance
As the target is engraved, the surface being processed gradually moves further away from the focal point, making it impossible to apply sufficient energy.
[NEW FUNCTION] DEEP ENGRAVING
The focal distance is changed after each pass. This allows for processing with maximum energy density at all times.