Easily perform high-speed image stitching and wide-field measurements with WIDE-Scan
A narrow field-of-view prevents a user from understanding the target as a whole and restricts the measurement range.
A high magnification image allows users to perform measurements with high-precision. However, as the magnification is increased, the field-of-view reduces, making it difficult to understand where you are looking or what you are looking at. WIDE-Scan allows users to quickly and easily generate a wider field-of-view image by stitching together multiple images.
Measuring only a single area often leads to incorrect data when applied to the entire target.
If only measuring a limited number of areas, the numerical values may vary depending on the locations being measured. WIDE-Scan obtains a wide-field, high-resolution 3D image and allows users to average data collected from a much larger sample area.