3D Laser Scanning Confocal Microscope

VK-X series

Problems Solved

Common Problems with Conventional Equipment

All of these limitations are overcome with a laser scanning microscope

Optical Microscope

Optical Microscope

It is impossible to focus on a target with an uneven surface at high magnification.

SEM

SEM

Observation can only be performed in black and white, sample size is limited and pre-processing is time consuming.

Roughness Gauge

Roughness Gauge

Projections and depressions cannot be measured without damaging the target area.

All of these limitations are overcome with a laser scanning microscope

Optical Microscope

Poor Resolution, Low Contrast

Poor Resolution, Low Contrast

Disc pits (6000x)

Shallow Depth-of-field

Shallow Depth-of-field

Blade edge (1000x)

No Support for Traceability

No Support for Traceability

High-resolution, Large Depth-of-field Observation

High Resolution, 24000x Magnification

High Resolution, 24000x Magnification

Disc pits (6000x)

Fully-focused Image

Fully-focused Image

Blade edge (1000x)

Traceability Compatible

Traceability Compatible

Measurement results obtained using the VK Series are highly reliable and comply with national traceability standards.

SEM

Monochrome Image Only

Monochrome Image Only

Ink toner (1000x)

Time-consuming Preparation and Observation

Time-consuming Preparation and Observation

Restricted Sample Size

Restricted Sample Size

Observation may not be possible due to the limited size of the sample chamber.

Rapid 3D Color Imaging

High-definition Color Image

High-definition Color Image

Ink toner (1000×)

No Sample Preparation

No Sample Preparation

Measure Samples of any Size and Nearly any Material

Measure Samples of any Size and Nearly any Material

Detachable head unit allows for a variety of sample sizes to be measured, can be integrated with other devices and supports remote operation.

Roughness Gauge

Sample Scratched due to Contact with Probe

Sample Scratched due to Contact with Probe

Aluminum surface (200x)
Horizontal indentations on screen.

Difficult to Measure Target Areas

Difficult to Measure Target Areas

Hitting the desired area of a target with a stylus can be problematic for targets like screw thread crests.

Resolution is Limited by Stylus Tip Diameter

Resolution is Limited by Stylus Tip Diameter

It is not possible to measure surfaces that are smaller than the tip of the roughness gauge's stylus.

Non-destructive Profile and Roughness Measurements

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