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Transparent Targets

Transparent/Mirror Surface Measurement Result Demonstration

SPECULAR REFLECTION TYPE

The LK-G5000 Series incudes a group of heads specifically designed for use on highly reflective targets such as glass or other mirror surfaces. These heads are available with wide or focused beam spots and are ideally suited for high accuracy measurements on such surfaces.

SPECULAR REFLECTION TYPE

SPOT DIAMETER (WIDE TYPE)

SPOT DIAMETER (WIDE TYPE)

SPOT DIAMETER (SPOT TYPE)

SPOT DIAMETER (SPOT TYPE)

Gap measurement of a touch panel

The optical system in these specialized heads has been optimized to obtain the maximum resolution possible on highly specular targets. By further improving the functionality of the receiver element, stable measurements of 20 μm 0.79 Mil gaps are now possible.

Gap measurement of a touch panel

Coarse Targets

Stable Measurement On Coarse Targets

WIDE SPOT TYPE

Surfaces that may appear flat, once magnified will often contain minute projections and depressions. This microscopic surface roughness can often cause measurement errors with conventional focused spot sensors. By using a sensor head with a wide beam spot, the effect of the uneven surface is averaged and stable measurements of even coarse targets are possible.

WIDE SPOT TYPE

SPOT DIAMETER

SPOT DIAMETER

Measurement of metal surfaces

Measurement of metal surfaces

Minimizes the influence of the roughness of a coarse target surface, including that of brushed metal surfaces and rubber surfaces. Never before seen measurement accuracy has now been achieved.

Cylindrical lensing

Due to the advanced cylindrical lensing used in the LK-G5000 Series, the wide axis of the beam spot is kept very consistent throughout the measurement range. This allows the averaging area to stay consistent even if the target is moved closer to or further from the sensor head.

Fine Targets

Optimal For Fine Or Profile Measurements

FOCUSED SPOT TYPE

The smallest spot diameter in its class of ø25 μm ø0.98 Mil (LK-H022) can measure any target, from fine components to profile measurements, with the highest level of accuracy in the industry.

FOCUSED SPOT TYPE

SPOT DIAMETER

SPOT DIAMETER

Measurement of the IC pin height

Thanks to delta cut technology, the influence of the distortion caused by the optical filter has been minimized. This and other improvements in the optical system mean that not only is the beam spot focused on the RS-CMOS, it is also very precisely focused on the target area. This allows high precision profile measurements that were not previously possible.

Measurement of the IC pin height