Micro-head Spectral-interference Laser Displacement Meter

SI-F series

  • CE Marking

1. Ultra high resolution 1nm

Spectral Interference Method that enables 1 nm Resolution

2. Head Variations That Expand the Range of Possible Measurements

The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.

3. Eliminates the Causes of Measurement Errors

The measurement head consists of only optical fibers and lenses, with no electronic parts

Download Catalog SI-F Series Micro-head Spectral-interference Laser Displacement Meter (Export Control Products included) Catalog (English)

SEE IT IN ACTION!

Your KEYENCE direct sales engineer can bring the product to your facility for a live demonstration. KEYENCE's sales engineers are highly trained and have extensive industry experience to help you find the solution you need.

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APPLICATION ASSISTANCE / SUPPORT / MORE

Need more information about one of our solutions? Want a price quote? Have a support question? Contact us with your inquiry and your local product expert will reach out to you with the best answer.

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Have a quick question or prefer to reach out by phone?

1-888-KEYENCE (1-888-539-3623)

*Callers will be directed to the nearest sales office.

Download Catalog SI-F Series Micro-head Spectral-interference Laser Displacement Meter (Export Control Products included) Catalog (English)

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Measurement Sensors