|
|
 |
|
Online Support and Services
|
|
|
|
|
|
|
| Features |
|
|
|
Accurately Measure Wafer Thickness |
|
| For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above. |
|
|
| The SI-F80R Series employs a near-infrared SLD that can penetrate through Si, GaAs, SiC, InP, a-Si, and other semiconductors. It can accurately measure wafer thickness, even when covered with BG (backgrind) tape. |
|
Best in its Class Specifications |
|
|
|
|
|
 |
|
|
|
|
|
Online Support and Services
|
|
|
|
|
|
|
|
|
|
|
|
|
| Related Information Topics |
|
|
|
|
| Related Product Downloads |
|
 |
Spectral-Interference Displacement Meter
|
|
| Micro-Head Spectral-Interference Laser Displacement Meter |
SI-F Series
NEW
|
|
 |
|
 |
|
 |
 |
| Spectral-Interference Wafer Thickness Meter |
SI-F80R Series
NEW
|
|
|
|
|
|
|
|
| Easy Setup Guide SI Series |
SI Series
NEW
|
|
|
 |
|
|
|
|
| Laser Confocal Displacement Meter |
LT-9000 Series
|
|
|
|
|
 |
|
|
|
|
| Product catalogs and manuals include both sensor head and controller information. |
|
|
|
Recommended Products!
|
|
|
|
|
|
| LJ-G Series NEW |
| High-accuracy 2D Laser Displacement Sensor |
|
|
 |
 Price Info |
| Request SI-F80R Series price information. |
|
|
|
|
|
|
|
