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SI-F80R Series Spectral-Interference Wafer Thickness Meter
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Specifications

SI-F80R Series Spectral-Interference Wafer Thickness Meter

Best in Class Performance with the Specifications to Back it Up.

For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.
Specifications: Wafer thickness measurement type
Wafer thickness measurement type
The sensor head and spectrum unit are calibrated as a pair. They are not interchangeable.
1. Indicates the thickness measurement range when the refractive index is 3.5. (The thickness measurement range is 35 to 1100 μm 1.38 to 43.31 mil when the refractive index is 1.)
2. Indicates the minimum beam spot diameter within the measurement range.
3. This value is obtained by measuring the gap between two glass plates with the number of averaging measurements set to 256, converted to a refractive index of 3.5.
4. This value is obtained by measuring a 0.3 mm 0.01" thick glass target within the possible detection distance with the number of averaging measurements set to 4096.
5. The laser classification for FDA is based on IEC60825-1 in accordance with the requirements of Laser Notice No. 50.
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