VK-X100/X200 series

FEATURES

Combines the capabilities of an optical microscope, SEM and roughness gauge

• This software module complies with ISO 25178 and allows users to complete measurements of several surface parameters.
• 200x - 24,000x magnification
• 0.5 nanometer Z-axis resolution on almost any material
• High-resolution, large depth-of-field observation
• Profile and roughness measurements with zero sample preparation
• Measures thickness and uniformity of clear layers
• No data loss - even on steep angles
• Perform measurements with just a single click

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  Problems Solved

  Common Problems with Conventional Profiling and Microscope Equipment

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  Observation of Unparalleled Clarity

  The Next Step in the Evolution of Optical Observation

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  Measure Any Surface Shape

  Robust measurement software provides flexibility for analysis

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  Fully-automated Measurements

  Now Anyone can Perform High-Quality Measurements

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  Wide-field Measurements

  Easily perform high-speed image stitching and wide-field measurements with WIDE-Scan

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  System Configuration

  VK Laser Scanning Microscope Options

Downloads:

• Catalogs
• Technical Guides
• Manuals
• Software