18,000x magnification with Z-axis resolution of 1nm
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Large depth-of-field comparable to SEMs
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Several analysis functions, including profile and roughness
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Nearly 80 degree angle of detection
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Measures thickness and uniformity of clear layers
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Non-contact with zero sample preparation
The easiest way to perform ultra-precision advanced analysis. The VK-9700 combines the convenience of an optical microscope, SEM and roughness gauge analyses features
Case Study : Quick and Precise Measuring Functions Significantly Reduce Investigation Time
