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VK-X100/X200 Series 3D Laser Scanning Microscope Online Support and Services

VK-X100/X200 Series 3D Laser Scanning Microscope

For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.

Problems Solved

Problems Solved

Common Problems with Conventional Profiling and Microscope Equipment
Observation of Unparalleled Clarity

Observation of Unparalleled Clarity

The Next Step in the Evolution of Optical Observation

Measure Any Surface Shape

Measure Any Surface Shape

Robust measurement software provides flexibility for analysis
Fully-automated Measurements

Fully-automated Measurements

Now Anyone can Perform High-Quality Measurements

Wide-field Measurements

Wide-field Measurements

Easily perform high-speed image stitching and wide-field measurements with WIDE-Scan
System Configuration

System Configuration

VK Laser Scanning Microscope Options

Product Specifications

Product Specifications

Product specification overview. For full details please download the product catalog.
Product Dimensions

Product Dimensions

Product dimension overview. For full product dimension details please download the product catalog.
Product Overview

3D Laser Scanning Microscope

•  200x - 24,000x magnification
•  0.5 nanometer Z-axis resolution on almost any material
•  High-resolution, large depth-of-field observation
•  Profile and roughness measurements with zero sample preparation
•  Measures thickness and uniformity of clear layers
•  No data loss - even on steep angles
•  Perform measurements with just a single click
Combines the capabilities of an optical microscope, SEM and roughness gauge
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