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VK-X100/X200 Series 3D Laser Scanning Microscope
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Features

Problems Solved

Common Problems with Conventional Equipment
For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.

All of these limitations are overcome with a laser scanning microscope


Optical Microscope
Optical Microscope
It is impossible to focus on a target with an uneven surface at high magnification.
SEM
SEM
Observation can only be performed in black and white, sample size is limited and pre-processing is time consuming.
Roughness Gauge
Roughness Gauge
Projections and depressions cannot be measured without damaging the target area.
All of these limitations are overcome with a laser scanning microscope

 
Optical Microscope



Poor Resolution, Low Contrast
Poor Resolution, Low Contrast
Disc pits (6000x)
Shallow Depth-of-field
Shallow Depth-of-field
Blade edge (1000x)
No Support for Traceability
No Support for Traceability
 
High-resolution, Large Depth-of-field Observation



High Resolution, 24000x Magnification
High Resolution, 24000x Magnification
Disc pits (6000x)
Fully-focused Image
Fully-focused Image
Blade edge (1000x)
Traceability Compatible
Traceability Compatible
Measurement results obtained using the VK Series are highly reliable and comply with national traceability standards.
 
SEM



Monochrome Image Only
 
Monochrome Image Only
Ink toner (1000x)
Time-consuming Preparation and Observation
Time-consuming Preparation and Observation
Restricted Sample Size
 
Restricted Sample Size
Observation may not be possible due to the limited size of the sample chamber.
 
Rapid 3D Color Imaging



High-definition Color Image
 
High-definition Color Image
Ink toner (1000×)
No Sample Preparation
 
No Sample Preparation
Measure Samples of any Size and Nearly any Material
Measure Samples of any Size and Nearly any Material
Detachable head unit allows for a variety of sample sizes to be measured, can be integrated with other devices and supports remote operation.
 
Roughness Gauge



Sample Scratched due to Contact with Probe
Sample Scratched due to Contact with Probe
Aluminum surface (200x)
Horizontal indentations on screen.
Difficult to Measure Target Areas
 
Difficult to Measure Target Areas
Hitting the desired area of a target with a stylus can be problematic for targets like screw thread crests.
Resolution is Limited by Stylus Tip Diameter
 
Resolution is Limited by Stylus Tip Diameter
It is not possible to measure surfaces that are smaller than the tip of the roughness gauge's stylus.
 
Non-destructive Profile and Roughness Measurements
 
 
 
 
 
 
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