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Online Support and Services
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| Features |
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Real Color and High Definition Examination |
Combines an Optical Microscope’s Color Reproducibility with a Laser Scanning Microscope’s High Definition and Ultra-depth Examination. |
| For full details, download the PRODUCT CATALOG using the CATALOG icon in the Online Support and Services box above |
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HD real color ultra-depth examination system [NEW] |
| The VK-9700 blends high definition and high contrast examination images obtained by scanning a short wavelength point light source with real color images obtained with a white light source. Each image can be viewed independently or combined for examination. |
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Light intensity image from laser light source
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| Color CCD unprocessed image from white light source |
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| Conventional method |
Commonly employed color ultradepth examination combines all color information obtained with a color CCD camera.
Since this method does not detect the confocal peak position, defocus light or false color might be mixed in an image.
Additionally, if images of whitish targets have color information obtained with a color CCD camera only, the contrast examination will be weak when displayed. |
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High Definition |
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| Real color high definition high contrast |
The HD real color ultra-depth examination system of the VK-9700 obtains color information for each pixel using the color CCD camera. The color information is aquired by using the confocal laser focus position.
The VK-9700 incorporates the aforementioned color information into high definition and highly contrasted laser light intensity images.
High definition real color ultra-depth examination images can be obtained that combine real color, high definition and highly contrasted characteristics . |
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Ultra-high precision mode [NEW] |
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Ultra-high precision mode performs a 2048 X 1536 pixel laser scan over the field of the microscope.
(Conventional high definition mode: 1024 X 768 pixel laser scan.)
High definition examination and high resolution measurement in the X-Y direction are possible. |
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| 408 nm short waveform semiconductor laser |
The following formula determines resolution in the XY direction of the microscope.
Constant X λ/N.A (λ: waveform of light source, N.A.: Numerical aperture of objective lens)
The VK-9700 employs the short waveform 408 nm semiconductor laser (optical waveform limit) as its light source. Incorporating an Apo lens (N.A.: 0.95) of 50x or 150x magnification with the short wavelength 408 nm semiconductor laser has enabled ultra high definition examination. |
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| Optical zoom |
Performs laser scanning (1024 X 768 pixels) over a narrow area in the field of the microscope.
The optical zoom of the VK-9700 zooms in on a target without deteriorating resolution as opposed to the digital zoom that deteriorates image quality. |
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| Related Information Topics |
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| Related Product Downloads |
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| Color 3D Laser Scanning Microscope |
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| Ultra-deep Color 3D Profile Measuring Microscope (Discontinued) |
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 Price Info |
| Request VK-9700 Series price information. |
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