CCD: Sectional Length Measurement (3000×)

Measure arc length and average height of a CCD microlens array using the high-magnification capabilities of the VK-X, which is not possible with a conventional optical microscope. Since the measurement is non-contact, there is no need to worry about damaging the lenses, and users can collect data over an entire area instead of just a single profile line.

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CCD: Sectional Length Measurement (3000×)