Problems Solved
Common Problems with Conventional Equipment
All of these limitations are overcome with a laser scanning microscope
- Optical Microscope
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It is impossible to focus on a target with an uneven surface at high magnification.
- SEM
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Observation can only be performed in black and white, sample size is limited and pre-processing is time consuming.
- Roughness Gauge
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Projections and depressions cannot be measured without damaging the target area.
- Poor Resolution, Low Contrast
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Disc pits (6000x)
- Shallow Depth-of-field
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Blade edge (1000x)
- No Support for Traceability
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- High Resolution, 24000x Magnification
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Disc pits (6000x)
- Fully-focused Image
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Blade edge (1000x)
- Traceability Compatible
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Measurement results obtained using the VK Series are highly reliable and comply with national traceability standards.
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Monochrome Image Only
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Ink toner (1000x)
- Time-consuming Preparation and Observation
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Restricted Sample Size
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Observation may not be possible due to the limited size of the sample chamber.
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High-definition Color Image
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Ink toner (1000×)
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No Sample Preparation
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- Measure Samples of any Size and Nearly any Material
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Detachable head unit allows for a variety of sample sizes to be measured, can be integrated with other devices and supports remote operation.
- Sample Scratched due to Contact with Probe
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Aluminum surface (200x)
Horizontal indentations on screen.
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Difficult to Measure Target Areas
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Hitting the desired area of a target with a stylus can be problematic for targets like screw thread crests.
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Resolution is Limited by Stylus Tip Diameter
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It is not possible to measure surfaces that are smaller than the tip of the roughness gauge's stylus.
- 3D Laser Scanning Confocal Microscope
- VK-X series
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