SI-F series
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This movie will give you an understanding of conditions in which a repeatability of 1 nm produces stabilized measurements. An explanation regarding the cutting-edge technology of the SI Series is provided.
This movie will provide an understanding of conditions in which thickness is measured with excellent stability, even with film that has buckling. It will be clear that the number values will not change, even if an incline of ±1 degree is generated.
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