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          Micro-head Spectral-interference Laser Displacement Meter

          SI-F series

          SI-F Series Demonstration Movies

          Solve all your application needs


          This movie will give you an understanding of conditions in which a repeatability of 1 nm produces stabilized measurements. An explanation regarding the cutting-edge technology of the SI Series is provided.

          Measuring thickness on both sides of the target

          This movie introduces conditions in which hard disk media is measured with ultra-high accuracy. You can experience the secrets of thickness measurement, including its measurement principle.

          Measuring film thickness

          This movie will provide an understanding of conditions in which thickness is measured with excellent stability, even with film that has buckling. It will be clear that the number values will not change, even if an incline of ±1 degree is generated.

          Thermal drift capabilities

          The SI-F Series can easily be installed in areas that have very little space structure. Also, because it is a measuring device that does not experience thermal drift, it is vastly effective for measuring chassis thermal behavior.

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          Measurement Sensors