The SI-F80R Series employs a near-infrared SLD that can penetrate
through Si, GaAs, SiC, InP, a-Si, and other semiconductors. It can
accurately measure wafer thickness, even when covered with BG
KEYENCE CORPORATION OF AMERICA 500 Park Boulevard, Suite 200, Itasca, IL 60143, U.S.A. Phone: 1-888-KEYENCE [1-888-539-3623] Callers from some carriers are experiencing difficulty reaching us. If you receive a busy tone, please try again or email us at the address below. E-mail: firstname.lastname@example.org Career Opportunities: KEYENCE Career Site
Copyright (C) 2020 KEYENCE CORPORATION. All Rights Reserved.