VK-X series
Robust Measurement Software Provides Flexibility for Analysis
The VK-Analyzer software can measure the height, width, cross-section, angle or radius-of-curvature of any user-specified line or curved cross-section profile.
Height, width, angle and cross-section measurement
(1000×)
Radius-of-curvature of a micro lens
(1000x)
Measures volume, surface area and surface area to area ratio of objects in any specified location on the screen.
Optical Film
(1000x)
Surface Area Measurement of a Solar Battery (1000x)
Calculate roughness on a 2D or 3D image for a given line.
Quantitatively determine differences in surface conditions by
measuring the surface roughness of a target.
Film - surface roughness comparison (3000x)
Analyze multiple layers at all points in the observation field. You can display 3D images and cross-section profiles of a selected single layer or multiple layers, and measure shapes or film thicknesses of user-specified locations.
Automatically measures the width and height of targets that have a repeating pattern. Since measurement is automatic, no user errors are generated, allowing for rapid, accurate measurement.
Resist Pattern (6000x)
Optical film (1000x)
Downloads
For Your Support