Suitable for pinpoint, high-pressure air purging static elimination
Since the SJ-M Series provides a direct static elimination structure that locates the ion generation point at the tip of the head, it enables high-speed and high-precision static elimination, where it is needed most.
[Standard probe type SJ-M021]
With its ultra-fine nozzle of ø10 mm (ø0.39"), a 0.5 MPa high-pressure air purge is possible.
[C.A.B. (Clean Air Barrier) probe type SJ-M021G]
Five times less maintenance than conventional models
[C.A.B. (Clean Air Barrier) probe type SJ-M031G/M071G]
Innovative design significantly reduces the need for cleaning/maintenance.
[Silicon probe type SJ-M031C/M071C]
Suitable for environments in which metal contamination must be avoided.
The SJ Series has adopted the pulse AC method that applies alternating high voltage to the electrode probe, producing ions of both polarities. Compared to the conventional AC method, the amount of ions generated is higher and the oscillating frequency can be changed. Therefore, the pulse AC method can be used in all conditions, from high-speed moving applications to static elimination of a work area.
The I.C.C. method conducts high-precision sensing of electrostatic charges on the target object and automatically controls ion generation quantities for the optimum level.
Since the static elimination head can be mounted close to or embedded within a metal object, it is suitable for installation into small equipment, regardless of mechanical restrictions.
The SJ-M Series provides heat resistance of up to 80°C (176°F), enabling use for applications in high-temperature environments.
Measuring conditions for comparative test conducted by
Charged voltage: +1 kV
Plate monitor: 150 mm x 150 mm 5.91" × 5.91" (20 pF)
Installation distance: 50 mm 1.97"
Measuring conditions for comparative test conducted by KEYENCE
Charged voltage: +/-1kV
Plate monitor: 150mm x 150mm 5.91" x 5.91" (20pF)
The increase in elimination time indicates how much maintenance is required.