Electronic Device Industry
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PCB Failure Analysis and PCB Defect Analysis -
Observation and Analysis of Plating Defects -
Observation and Quantitative Evaluation of Wiring Harnesses and Crimped Connectors -
Observation and Measurement of Connectors -
Observation and Measurement of Semiconductor Wafers and IC Designs Using Microscopes -
Inspection and Measurement of Solder Cracks and Voids -
Identifying Whisker Causes and Overcoming Inspection Problems