Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
Non-contact 3D metrology system performs nanometer level profile, roughness and thickness measurements on nearly any material.
High-precision, non-contact area profiler captures accurate and repeatable 3D measurements over a large area in just seconds.
An automated fluorescence microscope that offers similar functionality to a confocal, live cell incubator, and slide scanner.
Please check the item(s) you are interested in.
If you do not have an account, please create one now. You will only need to do this once.
Create an account now for unlimited instant access to all KEYENCE site resources in the future.
Back to top
Copyright (C) 2016 KEYENCE CORPORATION. All Rights Reserved.