can perform non-contact profile, roughness, and film thickness
measurements with nanometer-level resolution on any material or
By combining white
light with a laser light source, LSCMs are able to scan a surface
and collect both an optical image and high-resolution surface data.
Nanometer-level heights can be measured by analyzing the intensity
of the returned laser light relative to the z-position of the
measurement systems, such as contact profilers and interferometers
can damage the material being measured or are unable to provide
data on certain materials and surfaces. These devices can also be
costly, time-consuming to operate, and difficult to use.
Simply place your
sample on the stage, click measure, and the VK-X250 will
automatically scan and measure your sample. Our advanced analysis
software will automatically analyze the data and recommend key
roughness parameters to evaluate.
No Restrictions on
Automatically Compare and Analyze Multiple
Easy and Accurate Measurements Over a Wide
KEYENCE has been an industry
leader in sensing technology since 1974. KEYENCE's direct sales
team visits customers with live demo equipment to find the best
possible solution for all applications.
Learn more about
the VK Series 3D Laser Scanning Microscopes!
Non-contact Profile and Roughness Measurements on Nearly Any Material.
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