XM-5000 Series CMM
A probe is used to acquire multiple points on a workpiece surface and map their X, Y, and Z coordinates for measurement.
Just touch the part with the handheld probe to easily measure 3D/GD&T features. Even users with no previous CMM experience can intuitively use the system and understand what is being measured.
Wireless Probe with 6 DOF for Easy Measurement
Measure Complex Figures
Compact and Portable for In-Machine Measurements
Automatic Data Management
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