Interferometers suffer from data
dropout on samples with steep or curved surfaces, causing users to
make assumptions about their sample. The VK-X is able to capture
data on near-vertical surfaces, enabling users to make informed
decisions about their samples.
The VK-X captures full-focus,
high-resolution images that cannot be achieved with an
interferometer. Magnifications up to 28,000x can be attained,
providing SEM-like resolution.
White light interferometers
struggle to capture data from transparent surfaces, or surfaces
that do not easily reflect light. Laser microscopes are material
independent, enabling data to be captured on mirrored, matte, or
Simply place your sample on the stage, click measure, and
the VK-X1000 will automatically scan and measure your sample, with
no sample prep or leveling required.
VK-X Full Surface
Interferometer - Ink on
VK-X - Ink on
Learn more about the advantages
of the VK-X!
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