The VK-X3000 allows users to capture 3D measurements with sub-nanometer resolution, even on materials that are transparent, matte, or have curved/steep slopes.
By incorporating three different measurement methods: focus variation, laser confocal scanning, and white light interferometry, the system enables high-accuracy measurement and analysis to be performed on any target.
Since the system was designed to be easy-to-use, anyone is able to capture accurate surface data at the click of a button. The VK Series can automatically adjust to the optimum settings and accurately measure profiles, roughness, and film thickness of an entire surface.
Typically, users would need at least three different measurement systems to capture accurate data ranging from the millimeters to micrometers and nanometers , but the VK-X3000's triple scan approach allows for nearly any target to be measured with one system, no matter the material or shape.
