Film thickness gauge

Ultra High-accuracy
Reliable Measurement with Spectral interferometry

SI-F series

Ultra High Resolution

Spectral Interference Method that enables 1 nm Resolution.

Head Variations That Expand the Range of Possible Measurements

The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.

Eliminates the Causes of Measurement Errors

The measurement head consists of only optical fibers and lenses, with no electronic parts.

Laser Displacement Meter
SI-F Series
SI-F Series Micro-head Spectral-interference Laser Displacement Meter Catalog

We guarantee 100% privacy – your information will never be shared.

Privacy Statement

Online Member Benefits

  • Instant product catalog and technical guide downloads
  • Seamlessly submit requests for pricing and demonstrations
  • One-time registration, unlimited access


Step 1/3

Please provide the information below to create your KEYENCE web account. This One-Time registration unlocks unlimited access to our web resources.

Check Your Inbox

We've just emailed a verification link to .
Once it arrives, it will be valid for 24 hours.
Didn't receive an email? Please check your spam or junk folder.