Laser microscopes can perform non-contact profile, roughness, and film thickness measurements over an area with nanometer-level resolution on any material or shape.
Contact profilometers can damage the material being measured or are unable to provide data on certain materials and surfaces, such as glass, soft plastic, or surfaces with steep angles. The VK-X is captures full surface data, regardless of the material or sample shape.
Profilometers are limited to capturing a single line of data, providing a limited data set for the user. The VK-X captures full surface data on any material, enabling users to understand their sample in more detail, and make more-informed decisions.
Simply place your sample on the stage, click measure, and the VK-X1000 will automatically scan and measure your sample. Our advanced analysis software will automatically analyze the data and recommend key roughness parameters to evaluate. No more fixturing or sample prep required.
Steep Angle Measurements
Automatically Compare and Analyze Multiple Surfaces
Capture Full Surface Data
Measure Anywhere on the Surface
KEYENCE has been an industry leader in sensing and measurement technologies since 1974. KEYENCE's direct sales team consults with customers and provides on-site demonstrations of equipment to find the best possible solution for any application.
Learn more about how the VK-X compares to profilometers!
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