Automatic
3D Laser Scanning Microscope NEW3D Laser Scanning Confocal Microscope
VK-X Series

View Catalog

Profilometers

Limitations

Possible damage to sample
Hard to target desired measurement location
Resolution limited to diameter of stylus tip

Interferometers

Limitations

Sharp angles cannot be measured
Target needs to be level
No color-based observation

SEMs

Limitations

Vacuum required
Coating or other preprocessing required
No color-based observation

Difficult to use

Fully automated measurement

The VK-X Series enables precision measurement for all operators.

New algorithm
RPDII / AI Scanning
Just place and click
No leveling or special skills required

Non-contact laser-based measurement

No damage to targets
Instantaneous measurement of target area
Accurate measurement of steep angles
Measure across a 50 mm (1.97") area with nanometer resolution

High-definition full-color observation

High-resolution images that rival those of SEMs
Color observations at up to 28800×

Learn more in the catalog

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Automatic 3D Laser Scanning Microscope NEW3D Laser Scanning Confocal MicroscopeVK-X Series

Profilometers

Interferometers

SEMs

Fully automated measurement

Non-contact laser-based measurement

High-definition full-color observation

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Automatic
3D Laser Scanning Microscope NEW3D Laser Scanning Confocal Microscope
VK-X Series