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Non-Contact Displacement SensorAchieve Stable Thickness Measurements

  • Ultra-high resolution
  • High sampling speed
  • No heat generation
  • Easy configuration

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  • HOW DOES THE SENSOR WORK?

    The SI-F80 detects light interference patterns to measure thickness for film, glass, or wafers.
  • PERFORM STABLE MEASUREMENTS WITH EASE

    The SI-F80 is simple to configure and makes data collection easy.
  • SMALL HEAD SIZE, BIG PERFORMANCE

    This compact sensor has ultra-high resolution for sub-micron accuracy.
  • WANT TO KNOW MORE?

    Download the catalog or call 888-KEYENCE for pricing or to schedule a free onsite consultation.
  • Film In Process

  • Multi-Layered Film

  • Glass Disks

  • Base Layers

  • Catheter Balloons

SAME DAY SHIPPING, DIRECT SUPPORT, DIRECT SALES

WHY KEYENCE?

KEYENCE has been an industry leader in sensing technology since 1974. KEYENCE's direct sales team visits customers with live demo equipment to find the possible solution for all applications.

Learn more about the SI –Series Measurement Sensor

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