Reliable extraction of minute defects
Capture high-resolution images to extract defects otherwise impossible to see with a camera
Images with different stripe patterns are combined.
An image with only the defective area extracted is created.
- Different calculation methods are used to create multiple images.
Stable inspection of extracted defects
Stable inspection of conventionally difficult targets—from composite inspections of defects with varying conditions to inspections of complex shapes
Diffuse reflection image
- For more information on the NEW Line
Scan Vision System, see the catalog below