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Wide-area 3D profile-measuring instrument

Wide-area 3D profile-measuring instrument

Non-contact 3D profile-measuring instruments are mainly used for non-contact measurements of objects measured using stylus-type measurement instruments. Specializing in measurements ranging from millimeterse to tens of microns, these measuring instruments make it incredibly easy to measure an area covering a few square millimeters in about 4 seconds. Using a white LED to project a specialized striped pattern onto a target, non-contact 3D measuring instruments are able to measure roughness, curvature, and profiles with high accuracy. The built-in, high-sensitivity CMOS allows photos depicting the external appearance to be captured at the same time as profile measurements, making it possible to perform observations and measurements simultaneously.

Because light is applied at an angle, data from shaded areas or from the sides cannot be obtained, which makes this instrument unsuitable for ultra-high precision measurements similar to laser microscopes and atomic force microscopes (AFM).

Advantages Disadvantages
  • - Measurements take as little as 4 seconds
  • - Obtain 3D shapes and display color 3D images
  • - Quick measurements over a wide area, from an angle of several millimeters to several tens of millimeters
  • - Capable of both line and surface roughness measurements with just one machine
  • - Not suited for sub-micron roughness measurements
  • - Data cannot be obtained for sample areas that do not reflect light, such as the sides/walls of a sample
  • - Measurements are not possible for shaded locations

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