LumiTrax™ specular reflection lighting

High-speed control of striped pattern lighting
Accurately extracts microdefects

Ultra high-speed synchronization of the CMOS sensor and the light emission pattern allow for the generation of multiple images from a single image capture in accordance with the inspection details. A variety of surface defects that were previously only detected with the human eye can now be visualized with inline measurement.

LumiTrax™ Specular Reflection Mode Processing Principles

Calculate using images with different stripe patterns

Create an image with the defect extracted

Multiple images generated using different calculation methods

Major image types that can be generated with a single capture

Image type
(1) Normal image (2) Specular reflection image (3) Diffuse reflection image (4) Gloss ratio image (5) Shape image
Image generation method Averaging of all captured images Extract only the specular reflection component from stripe patterns Compare (1) and (2), extract the diffuse reflection component Compare (2) and (3), extract the differences in gloss/shininess Extract uneven fluctuating portions from the undulations in the stripe pattern
Main applications Understand overall image, used for position correction reference Used for inspection of streaking and abrasion on glossy surfaces Used for inspection of debris or fouling Used for damage inspections for cylinders and sides, surface dullness, etc. Used for inspection for dents and shallow unevenness


Inspection of metal cylinder surfaces (bearings, etc.)

Pin-holing & surface unevenness (shape image)
Streaking (diffuse reflection image)
Abrasion (specular reflection image)