3D Surface Profiler
VK-X3000 series
3D Surface Profiler VK-X3000 series
Outstanding Measurement Performance That Surpasses the Limits of White Light Interferometry
Triple scan approach — Surpassing conventional optical profilers
- Precise scanning unaffected by material and shape
- High-resolution color observation captures true-to-life images
- 292 different measurement tools allows for unsurpassed surface analysis
The VK-X3000 3D Surface Profiler uses a triple scan approach, where laser confocal scanning, focus variation, and white light interferometry measurement methods are used, so that high-accuracy measurement and analysis can be performed on any target. The VK-X3000 has a resolution of 0.01 nm and can scan areas up to 50 × 50 mm (1.97″ × 1.97″), allowing for measurement of the overall shape of the target while still maintaining high-resolution for analysis of minute surface features. KEYENCE's new 3D Surface Profiler can handle any target, including those with transparent or mirrored surfaces, large height changes, or steep angles.
Features
Optical Profiler Basics
Observation
Extensive magnification coverage, ranging from optical microscopes to SEMs
- Magnification up to 28,800×
- Automatic focusing
- Observe any material
Measurement
Instant, non-contact surface scanning
- No target damage
- Accurate nano-level measurement
- Compatible with any shape or material
Analysis
Unprecedented surface characterization
- Quantification of even the most detailed shapes
- Differentiate surfaces easily
- Roughness analysis
Precise Scanning Unaffected By Material and Shape
- Accurately measure steep slopes and angled surfaces
- Best-in-class XY resolution ensures even the smallest features are captured
- No data dropout on transparent or highly-reflective surfaces
High-Resolution Color Observation Captures True-to-Life Images
- Material texture, shape, and other surface conditions are clearly shown
- Color images make it possible to instantly determine where to measure
- High-magnification imaging up to 28,800x offers additional analysis capabilities
292 Different Measurement Tools Allows for Unsurpassed Surface Analysis
One system enables diverse analysis from profile measurement to roughness characterization.
Measure Both Flat and Uneven Surfaces
Millimeter, micrometer, and nanometer measurements in one device.
