Laser-based Elemental Analyzer

EA-300 series

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Laser-based Elemental Analyzer EA-300 series

New

Observe and instantly identify materials

  • One-click elemental analysis
  • No pre-processing or vacuum required
  • Automatically identify materials

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EA-300 series - Laser-based Elemental Analyzer

Introducing an elemental analyzer for use with VHX-7000 microscopes. Simply place the target on the stage to perform elemental analysis with no destruction, deposition, or vacuum required. AI-based recommendations make it possible for anyone to identify materials or foreign substances.

Features

Identify substances directly from your microscope

Place-and-analyze operation

One-click elemental analysis is possible.
Users can easily go from magnified observation to elemental analysis without needing to re-align or focus the laser objective lens.

No pre-processing or vacuum required

Non-destructive, alteration-free analysis is possible on targets of any size.
No conductivity treatment or vacuuming is required for analysis.

Nanosecond laser pulse / Plasma emission

Automatically identify materials

An integrated AI function will recommend the most likely detected material.
The database can also be used to collect historical in-house analysis results for reference when similar foreign particles are detected.

Nanosecond laser pulse / Plasma emission

The detected elements are analyzed.
The most likely material is instantly suggested.