3D Measurement Systems
Off-line 3D measurement systems for various industries and applications.
Lineup
The VL-800 Series 3D Scanner CMM is the first in its lineup to feature 3D-AI, making high-quality 3D data acquisition and analysis effortless for any user. The system intelligently recommends optimal scanning, stitching, and measurement methods based on the shape of the part being analyzed. Additionally, scanned parts can be directly compared to their CAD models for quick visualization of differences, or the 3D scan can be used to streamline reverse engineering processes. From scanning to STEP file output, the VL-800 handles everything automatically, and provides accurate data in a format accessible by any CAD software.
The Wide Area CMM WM-6000 Series of measuring instruments can easily measure the dimensions and shapes of products. Dimensions can be measured with the contact probe and shapes with the laser-scanning probe. The wireless probes eliminate routing limitations, allowing for easy measurement over a wide range. With no need for preprocessing such as spraying and sealing, scanning can be performed quickly and with high accuracy.
The XM Series is a handheld coordinate measuring machine (CMM) that lets anyone easily measure 3D/GD&T features. The system is portable and shop-floor ready, so measurements can be taken in any location. The unit also automatically records measurement data and creates detailed inspection reports. The images showcases our latest XM-5000 model which allows high-accuracy measurement for palm-sized parts to large applications.
The VR-6000 Wide-Area Optical Profiler performs non-contact measurement to replace stylus profilometers and roughness meters. This 3D profile system captures full surface data across the target with a resolution of 0.1 µm, enabling measurement of features that cannot be performed with probe-type instruments. The new rotational scanning greatly expands the measurement capabilities of the system. True-to-life cross section measurements can be performed with no blind spots. Wall thicknesses and recessed features can be measured without cutting or destroying the target. In addition, the HDR scanning algorithm provides enhanced scanning capabilities for instantly determining the optimal settings to capture high quality data, even on glossy and matte surfaces.
The VK-X4000 Series 3D Optical Profiling Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability.
