3D Optical Profiling Microscope VK-X4000 series

Confidently Measure Any 3D Surface

Three Integrated Principles Cover All Your 3D Measurement Needs

3 measurement principles in 1 system
Automatically measure multiple areas
across multiple parts
AI-Analyzer easily determines
key surface differences for you

VK-X4000 series - 3D Optical Profiling Microscope

The VK-X4000 Series 3D Optical Profiling Microscope combines laser confocal, white light interferometry, and focus variation methods into a single metrology system, enabling highly accurate, non-contact measurements on nearly any material and surface geometry. Its newly-developed multi-point measurement function further streamlines the analysis process by automating measurements across multiple locations and samples—eliminating complex setup or programming while delivering greater usability, throughput, and repeatability.

Features

Three Measurement Principles in One System: Unmatched 3D Precision for Any Surface, Any Material, Any Geometry

Laser Confocal

Measure any material, any shape.

White Light Interferometry

Accurately capture 3D surface data with sub-nanometer resolution.

Focus Variation

Measure fine surface detail over a large area.

Multi-Point Scan for Easy & Automated 3D Measurements

Multi-Point Measurement

Easily configure position, coordinates, and magnification settings simply by clicking the point to be measured.

Automatic Measurement of Multiple Features

Target features on a part can be easily selected. All measurement conditions are automatically applied.

Automatic Roughness Analysis

The Ra values between these two surfaces is the same, but samples clearly look different. With the AI-Analyzer, dozens of surface parameters are compared to instantly determine which ones show the strongest differences.

Ra: 2.3 µm

Ra and Rz are two of the most common roughness parameters, but there are numerous other parameters as well.
AI-Analyzer makes it easy to quickly determine which roughness parameter is best for a specific sample.