Micro-head Spectral-interference Laser Displacement Meter

SI-F series

  • CE Marking

1. Ultra high resolution 1nm

Spectral Interference Method that enables 1 nm Resolution

2. Head Variations That Expand the Range of Possible Measurements

The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.

3. Eliminates the Causes of Measurement Errors

The measurement head consists of only optical fibers and lenses, with no electronic parts

Download Catalog SI-F Series Micro-head Spectral-interference Laser Displacement Meter (Export Control Products included) Catalog

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Measurement Sensors