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          Micro-head Spectral-interference Laser Displacement Meter

          SI-F series

          Micro-Head Spectral-Interference Laser Displacement Meter


          Ultra high resolution 1nm

          Spectral Interference Method that enables 1 nm Resolution

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          Head Variations That Expand the Range of Possible Measurements

          The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.

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          Eliminates the Causes of Measurement Errors

          The measurement head consists of only optical fibers and lenses, with no electronic parts

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          Measurement Sensors