Micro-head Spectral-interference Laser Displacement Meter

SI-F series

Micro-Head Spectral-Interference Laser Displacement Meter


Ultra high resolution 1nm

Spectral Interference Method that enables 1 nm Resolution

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Head Variations That Expand the Range of Possible Measurements

The lineup includes ultra-small, long-range, and other specialized heads to match a variety of applications.

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Eliminates the Causes of Measurement Errors

The measurement head consists of only optical fibers and lenses, with no electronic parts

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Measurement Sensors