Combining the capabilities of an optical microscope, profilometer and an SEM.
The VK-X 3D laser scanning microscopes are able to perform noncontact profile, roughness, and thickness measurements with a 0.5 nm z-axis resolution. Designed to reduce user error and analysis time, the microscope has a new high-speed scan mode and one-touch automated operation, with no sample preparation needed.
Download the catalog for more information:
