Thickness measurement of wafers laminated with BG tape

The compact head can be mounted at a distance of 80 mm (3.15") from the target. The wafer thickness can be measured directly without the influence of the BG tape. The measurement can be continued all the time while the wafer is ground.

Micro-head Spectral-interference Laser Displacement Meter

SI-F series

Back to "Product Selection by Industry and Application"