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Automatically Measure and Analyze 3D Surfaces

The VK-X Series 3D Laser Scanning Confocal Microscope provides non-contact, nanometer-level profile, roughness, and film thickness data on any material, and indicates which metrics are most critical for evaluation.

  • NON-CONTACT MEASUREMENTS

    Measure profile, roughness, and film thickness with nanometer resolution

  • COLLECT DATA ON ANY MATERIAL

    Capture high-resolution surface data regardless of the material

  • HIGH ANGLE OF DETECTION

    Measure curved or steeply-sloped objects with low noise

  • HIGH-RESOLUTION /
    HIGH-MAGNIFICATION IMAGING

    Short wavelength laser produces higher resolution images with more detail than white light based systems

  • AUTOMATICALLY ANALYZE AND PROCESS MULTIPLE FILES

    Batch processing ensures uniformity and reproducibility between measurement results and reduces analysis time

  • EASY TO USE

    No need for sample processing or preparation. Software guides users through operation and even shows key differences between sample sets

  • Download the Catalog
    for More Information.

Click here to download

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