Frame ID reading

In the semiconductor manufacturing process, accurately reading the frame ID marked on a wafer ring (dicing frame) is crucial for ensuring traceability and thorough quality control. However, a common problem was that ID codes would get scratched or scuffed when the rings were stacked for storage and transport, leading to frequent reading errors with conventional code readers. These reading failures are a serious problem that directly leads to production line stoppages and decreased yield.

KEYENCE's SR-2000 Series 1D/2D code reader solves this problem. Equipped with a proprietary state-of-the-art reading algorithm and powerful image correction functions, it can instantly and stably read even challenging codes under adverse conditions such as scratches, dirt, and low contrast. This significantly reduces the risk of line stoppages due to reading errors and greatly contributes to improved productivity.

Furthermore, the SR-2000 Series supports an ultra-wide field of view and long-range reading, allowing it to reliably capture IDs even in environments where the distance to and position of the target can vary. Its high degree of installation freedom makes it easy to retrofit onto existing equipment, enabling accurate individual item management and enhanced traceability in semiconductor manufacturing.