Mounted Height Detection

Defects occur during molding if the height of each component after mounting is not within the specifications. Parallelism is produced by planar cutting, but inspections of parallelism use micron units. Using the GT2 Series enables measurement to a precision of 1 μm and resolution of 0.1 μm. Furthermore, multiple units can be installed in a narrow area because it is a ø8 pencil probe.