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        Atomic Force Microscopes (AFM)

        A type of scanning probe microscope that measures a target by moving a mechanical probe across the surface. These systems are capable of providing high-resolution data at the sub-nanometer level.

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        Related Downloads

        VHX-X1 Series Digital Microscope Catalog

        VHX-X1 Series Digital Microscope Catalog

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        Digital Microscope 18 Different Industries A Collection of Modern Observation Applications

        Digital Microscope 18 Different Industries A Collection of Modern Observation Applications

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